Cost-effective yield improvement in fault-tolerant VLSI memory

Publisher Website

1 January 1981

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 82-83
https://doi.org/10.1109/isscc.1981.1156242

Abstract

No abstract available

This publication has 2 references indexed in Scilit:

Reliability of LSI Memory Circuits Exposed to Laser Cutting
8th Reliability Physics Symposium, 1979
A fault-tolerant 64K dynamic RAM
Published by Institute of Electrical and Electronics Engineers (IEEE) ,1979