Adsorption-induced surface stress and its effects on resonance frequency of microcantilevers
- 15 April 1995
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 77 (8) , 3618-3622
- https://doi.org/10.1063/1.359562
Abstract
It is well known that bimetallic microcantilevers can exhibit static deflection as a result of thermal effects, including exothermic adsorption of chemicals on their surfaces. It is shown here that the resonance frequency of a cantilever can change due to a combination of mass loading and change of spring constant resulting from adsorption of chemicals on the surface. Cantilevers also undergo static bending that is induced by differential surface stress. The magnitude of these effects depends upon the chemical properties of the surface and upon the amount of material adsorbed. Hence cantilever deflection as well as resonance frequency change can be used as the basis for development of novel chemical sensors.This publication has 21 references indexed in Scilit:
- Vapor Detection Using Resonating MicrocantileversAnalytical Chemistry, 1995
- Thermal and ambient-induced deflections of scanning force microscope cantileversApplied Physics Letters, 1994
- Observation of a chemical reaction using a micromechanical sensorChemical Physics Letters, 1994
- Calibration of atomic-force microscope tipsReview of Scientific Instruments, 1993
- A nondestructive method for determining the spring constant of cantilevers for scanning force microscopyReview of Scientific Instruments, 1993
- Laser thermal effects on atomic force microscope cantileversUltramicroscopy, 1992
- Mechanical and thermal effects of laser irradiation on force microscope cantileversUltramicroscopy, 1992
- Scanning attractive force microscope using photothermal vibrationJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1991
- Improved atomic force microscope images using microcantilevers with sharp tipsApplied Physics Letters, 1990
- Investigation of mercury adsorption on gold films by STMJournal of Microscopy, 1988