Localization and the Minimum Metallic Conductivity in Si Inversion Layers
- 19 May 1975
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 34 (20) , 1293-1295
- https://doi.org/10.1103/physrevlett.34.1293
Abstract
We observe the "minimum metallic conductivity," , to be a decreasing function of surface-state charge density, , near the Si-Si interface. This dependence of on is contrary to Mott's concept of minimum metallic conductivity, but explains the large differences in reported in the recent literature.
Keywords
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