Boundary scattering and 1/f noise
- 1 December 1979
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 50 (12) , 8087-8089
- https://doi.org/10.1063/1.325947
Abstract
Noise measurements on thin bismuth films show that boundary scattering does not contribute to 1/f noise.This publication has 8 references indexed in Scilit:
- Lattice scattering causes 1/ƒ noisePhysics Letters A, 1978
- Concentration and mobility of charge carriers in thin polycrystalline films of bismuthThin Solid Films, 1978
- Flicker () noise: Equilibrium temperature and resistance fluctuationsPhysical Review B, 1976
- Influence of grain boundaries on the electrical resistivity of thin polycrystalline films: A correlation between the Mayadas-Shatzkes and the Wissmann-Wedler equationsThin Solid Films, 1975
- 1/f noise in thermo EMF of intrinsic and extrinsic semiconductorsPhysica, 1974
- Discussion of recent experiments on 1/ƒ noisePhysica, 1972
- 1/⨍ noise in continuous thin gold filmsPhysica, 1969
- The conductivity of thin metallic films according to the electron theory of metalsMathematical Proceedings of the Cambridge Philosophical Society, 1938