Influence of grain boundaries on the electrical resistivity of thin polycrystalline films: A correlation between the Mayadas-Shatzkes and the Wissmann-Wedler equations
- 1 December 1975
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 30 (2) , 371-375
- https://doi.org/10.1016/0040-6090(75)90101-7
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Exact and approximate equations for the thickness dependence of resistivity and its temperature coefficient in thin polycrystalline metal filmsThin Solid Films, 1973
- On the electrical resistivity of evaporated thin cobalt films; an approach based on the Mayadas-Shatzkes modelSurface Science, 1973
- Über den einfluss der polykristallinen struktur auf den elektrischen widerstand aufgedampfter nickelfilmeThin Solid Films, 1970
- Desorptionsspektren und Adsorptionszustände im System Nickel/WasserstoffBerichte der Bunsengesellschaft für physikalische Chemie, 1970
- Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External SurfacesPhysical Review B, 1970
- Resistivity and Structure of Evaporated Aluminum FilmsJournal of Vacuum Science and Technology, 1969
- ELECTRICAL RESISTIVITY MODEL FOR POLYCRYSTALLINE FILMS: THE CASE OF SPECULAR REFLECTION AT EXTERNAL SURFACESApplied Physics Letters, 1969
- The mean free path of electrons in metalsAdvances in Physics, 1952