The electric field distribution in the field ion microscope as a function of specimen shank
- 1 October 1980
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 51 (10) , 5537-5539
- https://doi.org/10.1063/1.327473
Abstract
A new empirical field calibration equation is presented. This relationship is obtained from a detailed numerical study of the field distribution within a real field ion microscope. The equation separates the important shank angle effect from the other geometric influences. Comparison is made of the predicted field with actual values.This publication has 6 references indexed in Scilit:
- On the electric field distribution within the field ion microscope and near the surface of field emittersJournal of Physics D: Applied Physics, 1979
- Field calibration using the energy distribution of a free-space field ionizationJournal of Applied Physics, 1977
- Field Calibration Using the Energy Distribution of Field IonizationPhysical Review Letters, 1973
- Properties of the tip-plane configurationJournal of Physics D: Applied Physics, 1971
- The electric field and the stress on a field-ion specimenSurface Science, 1970
- The behaviour of the field-ion microscope: A gas dynamical calculationSurface Science, 1970