Temperature coefficient of resistivity for polycrystalline Cu-films
- 3 October 1977
- journal article
- Published by Elsevier in Physics Letters A
- Vol. 62 (7) , 519-520
- https://doi.org/10.1016/0375-9601(77)90088-3
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Grain boundary contribution to the electrical conductivity of polycrystalline Cu filmsJournal of Physics F: Metal Physics, 1975
- Electron transport properties of thin copper films. I.Journal of Applied Physics, 1975
- Structural parameters of Cu filmsIl Nuovo Cimento B (1971-1996), 1975
- Growth, environmental, and electrical properties of ultrathin metal filmsJournal of Applied Physics, 1975
- Temperature coefficient of resistivity of polycrystalline filmsPhysics Letters A, 1973
- Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External SurfacesPhysical Review B, 1970
- The mean free path of electrons in metalsAdvances in Physics, 1952