Structural parameters of Cu films
- 1 March 1975
- journal article
- Published by Springer Nature in Il Nuovo Cimento B (1971-1996)
- Vol. 26 (1) , 148-156
- https://doi.org/10.1007/bf02755543
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- Misfit Accommodation by Imperfect Dislocations in Epitaxial fcc FilmsJournal of Applied Physics, 1970
- Rotation and Translation of Islands in the Growth of Heteroepitaxial FilmsJournal of Applied Physics, 1968
- The orientation of vapour depositsPhilosophical Magazine, 1962
- Effects of Thermal-Mechanical Treatments on Faulting in Some fcc AlloysJournal of Applied Physics, 1962
- X-Ray Measurement of Stacking Fault Widths in fcc MetalsJournal of Applied Physics, 1961
- Formation Conditions and Structure of Thin Epitaxial Silver Films on RocksaltJournal of Applied Physics, 1961
- Diffractometer measurement of low-order powder reflexionsActa Crystallographica, 1960
- Stacking faults in face-centred cubic metals and alloysPhilosophical Magazine, 1957
- X-Ray Diffraction by Face-Centered Cubic Crystals with Deformation FaultsJournal of Applied Physics, 1952
- LXXXVII.Investigation of the orientations in thin evaporated metallic films by the method of electron diffractionJournal of Computers in Education, 1933