Determining photothermally the thickness of a buried layer
- 1 September 1985
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 58 (5) , 1982-1985
- https://doi.org/10.1063/1.336006
Abstract
The conventional thermal-wave treatment following the Rosencwaig–Gersho theory is used to analyze the manner in which the properties of a layer buried within a sample influence the amplitude and the phase of surface-temperature oscillation during periodic heating by chopped light. This method can be applied to evaluate materials nondestructively in a manner similar to eddy current testing of electrically conductive layered samples: First experimental results on determining the thickness of a thin layer between an aluminum block and a 0.5-mm-thick blackened aluminum sheet are presented.This publication has 21 references indexed in Scilit:
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