Interfacial toughness measurements for thin films on substrates
Top Cited Papers
- 1 February 2002
- journal article
- review article
- Published by Elsevier in Acta Materialia
- Vol. 50 (3) , 441-466
- https://doi.org/10.1016/s1359-6454(01)00354-8
Abstract
No abstract availableKeywords
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