Biassed secondary electron imaging of monatomic surface steps on vicinal Si(100) in a UHV STEM
- 30 June 1991
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 35 (3-4) , 323-328
- https://doi.org/10.1016/0304-3991(91)90084-j
Abstract
No abstract availableThis publication has 17 references indexed in Scilit:
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