Geometrical Correction Factor for Semiconductor Resistivity Measurements by Four-Point Probe Method
- 1 November 1984
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 23 (11R)
- https://doi.org/10.1143/jjap.23.1499
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Four-point sheet resistance correction factors for thin rectangular samplesSolid-State Electronics, 1977
- Potential distribution in a rectangular semiconductor bar for use with four-point probe measurementsSolid-State Electronics, 1964
- On the influence of shape and variations in conductivity of the sample on four-point measurementsApplied Scientific Research, Section B, 1960
- Measurement of Sheet Resistivities with the Four-Point ProbeBell System Technical Journal, 1958
- The Potentials of Infinite Systems of Sources and Numerical Solutions of Problems in Semiconductor EngineeringBell System Technical Journal, 1955
- Advanced calculusPublished by Project Euclid ,1912