Noise and DC characteristics of power silicon diodes
- 1 October 1997
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 37 (10-11) , 1635-1638
- https://doi.org/10.1016/s0026-2714(97)00128-5
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Electrical Noise as a Measure of Quality and Reliability in Electronic DevicesPublished by Elsevier ,1993
- Use of the modulating differentiation technique to study breakdown inhomogeneities in avalanche transit time silicon diodeSolid-State Electronics, 1984
- Anomalous I-V and burst noise characteristics associated with surface channels in an NPN integrated transistorSolid-State Electronics, 1980