Si core-level excitation of hexamethyldisilane studied by synchrotron radiation and multiple-scattering X α calculation
- 1 February 1996
- journal article
- Published by Elsevier in Chemical Physics
- Vol. 203 (1) , 81-92
- https://doi.org/10.1016/0301-0104(95)00353-3
Abstract
No abstract availableKeywords
This publication has 35 references indexed in Scilit:
- 1sx-ray-absorption spectroscopy of: The effects of screening and core-hole relaxationPhysical Review B, 1994
- Photoelectron Spectra of Organometallic Compounds Containing Silicon-Silicon and Silicon-Germanium Bonds: Valence Band StudiesOrganometallics, 1994
- Si L- and K-edge x-ray-absorption near-edge spectroscopy of gas-phase Si((: Models for solid-state analogsPhysical Review B, 1993
- Double-crystal monochromator beam line on the Aladdin 1-GeV storage ringReview of Scientific Instruments, 1992
- Energies of .sigma.* orbitalsThe Journal of Physical Chemistry, 1991
- Single- and multiple-electron effects in the Si 1s photoabsorption spectra of Si (X=H,D,F,Cl,Br,,,,) molecules: Experiment and theoryPhysical Review A, 1990
- K-edge near-edge x-ray-absorption fine structure of oxygen- and carbon-containing molecules in the gas phasePhysical Review A, 1989
- Mark IV "Grasshopper" grazing incidence monochromator for the Canadian Synchrotron Radiation Facility (CSRF)Canadian Journal of Physics, 1982
- Overlapping core to valence and core to Rydberg transitions and resonances in the XUV spectra of SiF4Journal of Physics B: Atomic and Molecular Physics, 1980
- Evidence of Effective Potential Barriers in the X-Ray Absorption Spectra of MoleculesThe Journal of Chemical Physics, 1972