Cross-correlation technique for single-shot measurements of weak light pulses
- 15 February 1995
- journal article
- Published by Optica Publishing Group in Optics Letters
- Vol. 20 (4) , 407-409
- https://doi.org/10.1364/ol.20.000407
Abstract
We have developed and demonstrated a simple, single-shot method to measure the duration of a weak ultrafast pulse. The density of free electrons in a semiconductor is changed by a pump beam, causing a time-dependent variation of the refractive index, which in turn determines the spatial distribution of the reflected probe-beam intensity. The derivative of the spatial distribution in the transition region is a cross correlation of the pump and probe pulses. This technique is suitable for measuring weak pulses such as low-level synchrotron light in the mid-infrared-to-far-infrared range.Keywords
This publication has 11 references indexed in Scilit:
- Generation of high-power sub-single-cycle 500-fs electromagnetic pulsesOptics Letters, 1993
- Trapping time in processed polycrystalline silicon measured by picosecond time-resolved reflectivityJournal of Applied Physics, 1988
- Single-shot measurement of a 52-fs pulseApplied Optics, 1987
- Recombination mechanisms in Si and Si thin films determined by picosecond reflectivity measurements near Brewster’s angleApplied Physics Letters, 1986
- Pulse-shape determination of intracavity compressed picosecond pulses by two-photon fluorescence analysisOptical and Quantum Electronics, 1986
- Amplification of picosecond 10 µm pulses in multiatmosphere CO2lasersIEEE Journal of Quantum Electronics, 1985
- Autocorrelation of ultrashort optical pulses using polarization interferometryOptics Letters, 1983
- Picosecond microwave pulse generationApplied Physics Letters, 1981
- On a possibility of analysing the temporal characteristics of short light pulsesOptics Communications, 1977
- Synchrotron Radiation as an Infrared SourceApplied Optics, 1973