A robust integrated multibias parameter-extraction method for MESFET and HEMT models
- 1 May 2000
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 48 (5) , 777-786
- https://doi.org/10.1109/22.841871
Abstract
No abstract availableKeywords
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