Free-Space Permittivity Measurements on Dielectric Materials at Millimeter Wavelengths
- 1 March 1978
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 27 (1) , 54-58
- https://doi.org/10.1109/tim.1978.4314617
Abstract
A system is described for measuring the complex permittivities of rigid dielectric sheet materials at millimeter wavelengths, using free-space transmission techniques and Brewster angle determinations. A first-order analysis is given for the effect of multiple reflections in thick low-loss dielectric sheets, under conditions of oblique incidence. Values of ϵr and tan δ are given for selected sheet materials at 35 GHz and 25°C, that are estimated to be accurate to ±5 percent.Keywords
This publication has 4 references indexed in Scilit:
- Rapid Measurement of Dielectric Substrate Permittivity at X BandIEEE Transactions on Instrumentation and Measurement, 1975
- Precise Measurements on Dielectric and Magnetic MaterialsIEEE Transactions on Instrumentation and Measurement, 1974
- Error Analysis for Waveguide-Bridge Dielectric-Constant Measurements at Millimeter WavelengthsIEEE Transactions on Instrumentation and Measurement, 1969
- Optical Methods for the Measurement of Complex Dielectric and Magnetic Constants at Centimeter and Millimeter WavelengthsIEEE Transactions on Microwave Theory and Techniques, 1954