Carrier Traps in Polyethylene Naphthalate (PEN): Photoelectret
- 1 July 1982
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 21 (7R) , 1025-1027
- https://doi.org/10.1143/jjap.21.1025
Abstract
Electronic carrier traps in polyethylene naphthalate (PEN) were investigated by TSC and TL analysis in the temperature range from -196°C to 160°C. Two broad peaks were observed in the TSC and TL from PEN films illuminated with light of wavelength 360 nm at -196°C. The detrapping process was closely related to the molecular motions, the so-called γ and β relaxations. The apparent trap depths ranged from 0.1–0.5 eV.Keywords
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