A study in coverage-driven test generation
- 20 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Functional verification methodology of Chameleon processorPublished by Association for Computing Machinery (ACM) ,1996
- Test Program Generation for Functional Verification of PowePC Processors in IBMProceedings of the 39th conference on Design automation - DAC '02, 1995
- Architecture validation for processorsPublished by Association for Computing Machinery (ACM) ,1995