Character of Si-SiO2 interface states from analysis of the CV term spectra

This publication has 20 references indexed in Scilit:

• Spectrum and nature of surface states
  Surface Science, 1974
• Surface state density evaluation using high-frequency MOS capacitance technique
  Physica Status Solidi (a), 1974
• Theoretical origins of Nss peaks observed in Gray-Brown MOS studies
  Applied Physics Letters, 1973
• Characterization of Surface States at the Si-SiO[sub 2] Interface Using the Quasi-Static Technique
  Journal of the Electrochemical Society, 1971
• A quasi-static technique for MOS C-V and surface state measurements
  Solid-State Electronics, 1970
• DENSITY OF SiO2–Si INTERFACE STATES
  Applied Physics Letters, 1966
• An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodes
  Solid-State Electronics, 1962
• Eigenschaften gewöhnlicher Halbleiteroberflächen
  Physica Status Solidi (b), 1962
• Analytic Properties of Bloch Waves and Wannier Functions
  Physical Review B, 1959
• Feldeffekt und Reaktionen an der Oberfläche von Germanium
  Annalen der Physik, 1959