Influence of cell structure on the SEU sensitivity of a SRAM

Publisher Website

30 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/radecs.1993.316520

Abstract

No abstract available

Keywords

This publication has 3 references indexed in Scilit:

An experimental facility for the study of effects of heavy ion irradiation on logic microcircuits
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1987
Soft Error Susceptibility of CMOS RAMS: Dependence upon Power Supply Voltage
IEEE Transactions on Nuclear Science, 1981
Alpha-particle-induced soft errors in dynamic memories
IEEE Transactions on Electron Devices, 1979