X-ray diffraction investigation of diffusion in PbTe–PbSe superlattices
- 10 March 1999
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 198-199, 1211-1215
- https://doi.org/10.1016/s0022-0248(98)01075-6
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Stoichiometric defects and volume diffusion in epitaxial PbTe‐SnTe multilayersCrystal Research and Technology, 1994
- Layer intermixing in HgTe-CdTe superlatticesApplied Physics Letters, 1986
- Application de la théorie dynamique de la diffraction X à l'étude de la diffusion du bore et du phosphore dans les cristaux de siliciumActa Crystallographica Section A, 1968