A scanning electron microscope study of the role of copper oxide layers on arc cathode erosion rates
- 1 June 1977
- journal article
- Published by Springer Nature in Journal of Materials Science
- Vol. 12 (6) , 1095-1104
- https://doi.org/10.1007/bf00553598
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Switching model of arc root initiation on oxide-coated cold cathodesElectronics Letters, 1976
- Oxide films on arc cathodes and their emission and erosionJournal of Physics D: Applied Physics, 1975
- Time variation in copper cathode erosion rate for long-duration arcsJournal of Physics D: Applied Physics, 1975
- The effect of rotating arc velocity on copper cathode erosionJournal of Physics D: Applied Physics, 1974
- Stored charges in relatively thin oxide filmsJournal of Physics D: Applied Physics, 1972
- Electrothermal Initiation of an Electronic Switching Mechanism in Semiconducting GlassesJournal of Applied Physics, 1970