Alumina-Ti Interface Reactions Studied By AES And UPS

This publication has 14 references indexed in Scilit:

• Chemical reactions at Pt/oxide/Si and Ti/oxide/Si interfaces
  Journal of Vacuum Science & Technology A, 1985
• Chemical bonding and reactions at Ti/Si and Ti/oxygen/Si interfaces
  Journal of Vacuum Science & Technology A, 1983
• Silicide and Schottky barrier formation in the Ti-Si and the Ti-SiOx -Si systems
  Journal of Applied Physics, 1982
• Al-Al2O3interface study using surface soft-x-ray absorption and photoemission spectroscopy
  Physical Review B, 1979
• Auger and X-ray photoelectron spectroscopic depth profiling techniques applied to ultra-thin titanium films
  Thin Solid Films, 1978
• Electron spectroscopy studies of the chemisorption of O2, H2 and H2O on the TiO2(100) surfaces with varied stoichiometry: Evidence for the photogeneration of Ti+3 and for its importance in chemisorption
  Surface Science, 1978
• Oxidation of Aluminum Surfaces Studied by Synchrotron Radiation Photoelectron Spectroscopy
  Physica Scripta, 1977
• Deconvolution method for composition profiling by Auger sputtering technique
  Surface Science, 1976
• Techniques for elemental composition profiling in thin films
  C R C Critical Reviews in Solid State Sciences, 1973
• Photoemission energy level measurements of sorbed gases on titanium
  Solid State Communications, 1972