Auger and X-ray photoelectron spectroscopic depth profiling techniques applied to ultra-thin titanium films
- 1 July 1978
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 52 (2) , 271-280
- https://doi.org/10.1016/0040-6090(78)90145-1
Abstract
No abstract availableKeywords
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