Planar Resistors for Probe Station Calibration
- 1 December 1992
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Transmission line capacitance measurementIEEE Microwave and Guided Wave Letters, 1991
- Characteristic impedance determination using propagation constant measurementIEEE Microwave and Guided Wave Letters, 1991
- Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network AnalyzerIEEE Transactions on Microwave Theory and Techniques, 1979