High-resolution electron microscopy studies of Ni silicides formed in lateral diffusion couples
- 31 December 1985
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 18 (1-4) , 297-303
- https://doi.org/10.1016/0304-3991(85)90147-0
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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