Space Compression Methods With Output Data Modification
- 1 March 1987
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 6 (2) , 290-294
- https://doi.org/10.1109/tcad.1987.1270273
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- A data compression technique for built-in self-testIEEE Transactions on Computers, 1988
- Built-In Self-Test TechniquesIEEE Design & Test of Computers, 1985
- Syndrome-Testable Design of Combinational CircuitsIEEE Transactions on Computers, 1980
- Transition Count Testing of Combinational Logic CircuitsIEEE Transactions on Computers, 1976
- An Advanced Fault Isolation System for Digital LogicIEEE Transactions on Computers, 1975