A data compression technique for built-in self-test
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. 37 (9) , 1151-1156
- https://doi.org/10.1109/12.2271
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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