Thickness fluctuations and electric field penetration in thin metal-insulator-metal structures
- 30 November 1968
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 11 (11) , 1063-1067
- https://doi.org/10.1016/0038-1101(68)90128-7
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Capacitance of Thin Dielectric StructuresJournal of Applied Physics, 1964
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- Natural and Thermally Formed Oxide Films on AluminumJournal of the Electrochemical Society, 1956