Deep center characterization by optically-controlled paramagnetic resonance in AgGaS2

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Abstract
A new method for deep center characterization, based on the analysis of their EPR signal intensity under a dual beam optical excitation, is presented. It allows the determination of some important physical parameters of a deep center, like its photoionization energy and its optical capture cross section. An application of this method is given by the study of two transition metal‐induced defects in the chalcopyrite compound AgGaS2. The basic interest of this new technique rests in the fact that it yields a quantitative value of parameters useful in deep level theory and that it may help to bridge the gap between physically assessed centers and their chemical identification by regular EPR technique.