Efficacy of Ar in reducing the kink effect on floating-body NFD/SOI CMOS
- 27 November 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Scalability of partially depleted SOI technology for sub-0.25 μm logic applicationsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- A 7.9/5.5 psec room/low temperature SOI CMOSPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002