Time-and angle resolved reflection spectroscopy of the oxide layer formation on metal surfaces
- 1 March 1986
- journal article
- Published by Elsevier in Journal of Molecular Structure
- Vol. 143, 251-254
- https://doi.org/10.1016/0022-2860(86)85250-4
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- The Growth and Reduction of Duplex Oxide Films on CopperBerichte der Bunsengesellschaft für physikalische Chemie, 1985
- Ramanspektroskopie an Oxidschichten auf Reineisen im ElektrolytenAnalytical and Bioanalytical Chemistry, 1984
- In situ characterization of electrochemically-formed oxide films on low carbon steel by diffuse reflectance spectroscopyAnalytical and Bioanalytical Chemistry, 1984
- Differential reflectometry and its application to the study of alloys, ordering, corrosion, and surface propertiesPhysica Status Solidi (a), 1983
- Production of Polycrystalline n-TiO2-Layers for Photoelectrodiemical PurposeZeitschrift für Naturforschung A, 1981