Relationship between Critical Current Fluctuation of Superconducting Bicrystal Junction and Junction Parameters
- 1 April 1999
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 38 (4B) , L433
- https://doi.org/10.1143/jjap.38.l433
Abstract
Critical current fluctuation of bicrystal junctions is estimated from the 1/f flux noise of the superconducting quantum interference device (SQUID) at T=77 K. The relationships between the current fluctuation and junction parameters, such as critical current I o and resistance R, are obtained. The obtained parameter dependence can be well explained by using the parameter dependence of the resistance fluctuation reported by Marx and Gross [Appl. Phys. Lett. 70, 120 (1997)] and the relationship between I o and R obtained for the present junctions. The agreement indicates that the critical current fluctuation is correlated with the resistance fluctuation through the relationship between I o and R.Keywords
This publication has 12 references indexed in Scilit:
- Properties of Josephson Junction Fabricated on Bicrystal Substrate with Different Misorientation AnglesJapanese Journal of Applied Physics, 1998
- Low-noise YBa2Cu3O7−x single layer dc superconducting quantum interference device (SQUID) magnetometer based on bicrystal junctions with 30° misorientation angleApplied Physics Letters, 1998
- High Performance DC Superconducting Quantum Interference Device Utilizing a Bicrystal Junction with a 30° Misorientation AngleJapanese Journal of Applied Physics, 1997
- Physics and technology of high temperature superconducting Josephson junctionsIEEE Transactions on Applied Superconductivity, 1997
- Scaling behavior of 1/f noise in high-temperature superconductor Josephson junctionsApplied Physics Letters, 1997
- Parameter dependencies of characteristics of a high-T c dc superconducting quantum interference deviceJournal of Applied Physics, 1995
- Low-noise YBa2Cu3O7−δ direct-current superconducting quantum interference device magnetometer with direct signal injectionApplied Physics Letters, 1995
- Flicker (1/f) noise in biepitaxial grain boundary junctions of YBa2Cu3O7−xApplied Physics Letters, 1992
- 1/f noise in superconducting bicrystal grain-boundary junctionsPhysical Review Letters, 1992
- Identifying the source of 1/f noise in SQUIDs made from high-temperature superconductorsApplied Physics Letters, 1992