Characterization of a pulsed X-ray source for fluorescent lifetime measurements
- 1 August 1994
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 41 (4) , 698-702
- https://doi.org/10.1109/23.322791
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Design of a pulsed X-ray system for fluorescent lifetime measurements with a timing accuracy of 109 PSPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- X-ray fluorescence measurements of 412 inorganic compoundsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Prospects for new inorganic scintillatorsIEEE Transactions on Nuclear Science, 1990
- Subnanosecond fluorescence quenching of dye molecules in solutionThe Journal of Chemical Physics, 1977