Copper electromigration in aluminum
- 1 February 1977
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 48 (2) , 473-477
- https://doi.org/10.1063/1.323689
Abstract
The apparent effective charge Z**Cu, of copper in aluminum was measured using a quasi‐steady‐state technique. Z**Cu was measured in the temperature range 325–500 °C at several current densities. The measured values ranged between −4.1 and −14.9. No clear current density or temperature dependence could be seen, except for a possible increase in Z**Cu with decreasing temperature.This publication has 14 references indexed in Scilit:
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