The Importance of the Ni to Ge Ratio and of the Annealing Cycle for the Resistivity and Morphology of NiAuGe Ohmic Contacts To n-GaAs
- 16 December 1987
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 104 (2) , 903-916
- https://doi.org/10.1002/pssa.2211040246
Abstract
No abstract availableKeywords
This publication has 41 references indexed in Scilit:
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