Characterization of the interface states at A1-GaAs schottky barriers with a thin interface layer
- 1 June 1983
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 26 (6) , 537-538
- https://doi.org/10.1016/0038-1101(83)90168-5
Abstract
No abstract availableKeywords
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