Coincidence studies of doubly charged ions formed by 30.4 nm photoionization
- 1 February 1985
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Processes
- Vol. 63 (2-3) , 241-264
- https://doi.org/10.1016/0168-1176(85)80028-8
Abstract
No abstract availableKeywords
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