Electrostatic force microscopy of silver nanocrystals with nanometer-scale resolution
- 29 September 1997
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 71 (13) , 1878-1880
- https://doi.org/10.1063/1.119425
Abstract
Silver nanoparticles on graphite basal plane surfaces were concurrently imaged using electrostatic force microscopy (EFM) and noncontact atomic force microscopy. EFM images were obtained having a lateral resolution of 4–5 nm, and a resolution perpendicular to the surface of ≈1 nm. The dependence of the contrast in the EFM data for the silver nanoparticles as a function of the applied tip bias was consistent with a positive charge for the silver nanocrystals on the graphite surface, qualitatively as expected by theory.Keywords
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