Electrostatic forces acting on the tip in atomic force microscopy: Modelization and comparison with analytic expressions
- 1 February 1997
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 81 (3) , 1023-1030
- https://doi.org/10.1063/1.363884
Abstract
No abstract availableThis publication has 22 references indexed in Scilit:
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