In situ observation by X-ray synchrotron topography of the growth of plastically deformed regions around crack tips in silicon under creep conditions

This publication has 5 references indexed in Scilit:

• Observation par topographie aux rayons X des configurations de dislocations développées a l'extrémité d'une fissure dans le silicium
  Philosophical Magazine A, 1980
• Velocities of screw and 60° dislocations in n- and p-type silicon
  Physica Status Solidi (a), 1979
• X-ray topography and dynamics: Description of two experiments performed at LURE DCI
  Nuclear Instruments and Methods, 1978
• X-ray topography settings: White beam topography and direct viewing detectors, two-axis spectrometer
  Nuclear Instruments and Methods, 1978
• The brittle-to-ductile transition in pre-cleaved silicon single crystals
  Philosophical Magazine, 1975