Determination of the refractive index and thickness of a transparent film on a transparent substrate from the angles of incidence of zero reflection-induced ellipticity
- 31 March 1978
- journal article
- Published by Elsevier in Optics Communications
- Vol. 24 (3) , 351-354
- https://doi.org/10.1016/0030-4018(78)90027-5
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Polarization-independent reflectance matching (PRIM): A technique for the determination of the refractive index and thickness of transparent filmsJournal of Optics, 1977
- Polarizer–surface-analyzer null ellipsometry for film–substrate systems*Journal of the Optical Society of America, 1975