Time-Resolved, Laser-Induced Phase Transformation in Aluminum
- 1 January 1984
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 15 references indexed in Scilit:
- Low-Energy Electron Diffraction during Pulsed Laser Annealing: A Time- Resolved Surface Structural StudyPhysical Review Letters, 1984
- Femtosecond-Time-Resolved Surface Structural Dynamics of Optically Excited SiliconPhysical Review Letters, 1983
- Time-Resolved Reflectivity Measurements of Femtosecond-Optical-Pulse-Induced Phase Transitions in SiliconPhysical Review Letters, 1983
- Picosecond time-resolved plasma and temperature-induced changes of reflectivity and transmission in siliconApplied Physics Letters, 1982
- Picosecond electron diffractionApplied Physics Letters, 1982
- Measurement of the Velocity of the Crystal-Liquid Interface in Pulsed Laser Annealing of SiPhysical Review Letters, 1982
- Formation of Stable Pinch Column in Focus PlasmaJournal of the Physics Society Japan, 1980
- A picosecond jitter streak cameraApplied Physics Letters, 1980
- Subpicosecond chronoscopyApplied Physics Letters, 1975
- Measurements of Equilibrium Vacancy Concentrations in AluminumPhysical Review B, 1960