An Experimental Investigation of the Parallel-Plate EMP Simulator with Single-Pulse Excitation
- 1 August 1983
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electromagnetic Compatibility
- Vol. EMC-25 (3) , 358-366
- https://doi.org/10.1109/temc.1983.304100
Abstract
The properties of the parallel-plate Harvard EMP simulator (HES) are studied in the time domain under single-pulse excitation. The behavior of the HES is observed through three windows: the voltage at the driving point, the current and charge densities on the surfaces of the top plate, and the electric field between the plates in the simulator. In order to eliminate the systematic interference which can be quite severe, a new technique of "dual measurements" has been developed and more accurate data have been obtained. The measurements have been interpreted with the help of knowledge acquired from earlier continuous-wave investigations and from studies with the similar rhombic EMP simulator.Keywords
This publication has 8 references indexed in Scilit:
- The Dual-Measurement Procedure for Eliminating Systematic InterferenceIEEE Transactions on Electromagnetic Compatibility, 1984
- The Matching Between an EMP Simulator and the Pulse GeneratorIEEE Transactions on Electromagnetic Compatibility, 1984
- Theoretical Analysis of the Rhombic Simulator Under Pulse ExcitationIEEE Transactions on Electromagnetic Compatibility, 1983
- An Experimental Investigation of the Rhombic EMP Simulator Under Pulse ExcitationIEEE Transactions on Electromagnetic Compatibility, 1983
- Experimental Investigation of the Rhombic EMP Simulator: Comparison with Theory and Parallel-Plate SimulatorIEEE Transactions on Electromagnetic Compatibility, 1982
- The Rhombic EMP SimulatorIEEE Transactions on Electromagnetic Compatibility, 1982
- Standing Waves and Notches in an EMP Simulator and Their ReductionIEEE Transactions on Electromagnetic Compatibility, 1981
- The Electromagnetic Field in an EMP Simulator at a High FrequencyIEEE Transactions on Electromagnetic Compatibility, 1979