The Dual-Measurement Procedure for Eliminating Systematic Interference
- 1 February 1984
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electromagnetic Compatibility
- Vol. EMC-26 (1) , 14-18
- https://doi.org/10.1109/TEMC.1984.304172
Abstract
A special "dual-measurement" procedure has been introduced for eliminating systematic interference in electromagnetic measurements. This interference has its origin in the same source as the measured signal and is usually picked up by the cables, chassis, and objects other than the sensor. The interference, when superimposed on the signal being measured, obscures the signal and degrades the accuracy of the measurement. The use of the dual-measurement procedure can notably reduce the systematic interference and greatly improve the clarity and accuracy of the measurement.Keywords
This publication has 6 references indexed in Scilit:
- The Matching Between an EMP Simulator and the Pulse GeneratorIEEE Transactions on Electromagnetic Compatibility, 1984
- An Experimental Investigation of the Parallel-Plate EMP Simulator with Single-Pulse ExcitationIEEE Transactions on Electromagnetic Compatibility, 1983
- An Experimental Investigation of the Rhombic EMP Simulator Under Pulse ExcitationIEEE Transactions on Electromagnetic Compatibility, 1983
- The Cylindrical Dipole as a Sensor or ProbeIEEE Transactions on Electromagnetic Compatibility, 1982
- Sensors for Electromagnetic Pulse Measurements Both Inside and Away from Nuclear Source RegionsIEEE Transactions on Electromagnetic Compatibility, 1978
- Sensors for electromagnetic pulse measurements both inside and away from nuclear source regionsIEEE Transactions on Antennas and Propagation, 1978