Combined scanning near field optical and force microscopy
- 1 June 1993
- journal article
- research article
- Published by Wiley in Microscopy Research and Technique
- Vol. 25 (2) , 177-178
- https://doi.org/10.1002/jemt.1070250212
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Evanescent-field optical microscopy: effects of polarization, tip shape and radiative wavesUltramicroscopy, 1992
- Near-field differential scanning optical microscope with atomic force regulationApplied Physics Letters, 1992
- Combined shear force and near-field scanning optical microscopyApplied Physics Letters, 1992
- New form of scanning optical microscopyPhysical Review B, 1989