Analysis and measurement of nonlinear effects in power amplifiers caused by thermal power feedback

2 January 2003

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

Vol. 2, 758-761
https://doi.org/10.1109/iscas.1992.230111

Abstract

In order to calculate and measure the influence of the internal-power-dependent thermally effected feedback in power amplifiers with bipolar transistors, a calculation method and measurement techniques are proposed, and results are presented. The aim was to describe a transistor including thermal power feedback and the surrounding network in a theoretical model, i.e. to find a mathematical description. A further objective was to clarify which distortion results from the pure electrical transistor properties and which additional distortion is caused by thermal feedback.

Keywords

This publication has 3 references indexed in Scilit:

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Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
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