Nonlinear effects in transistors caused by thermal power feedback: simulation and modeling in SPICE

2 January 2003

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

Vol. 2, 879-882
https://doi.org/10.1109/iscas.1992.230081

Abstract

In order to evaluate the influence of the internal power dependent thermally effected feedback in bipolar transistors, a model for SPICE simulation is proposed which considers several variable temperature influences on transistor parameters as well as a complex thermal network. Measurement methods for determination of essential parameter values are suggested. Results of SPICE simulations are presented.

Keywords

SPICE
POWER DISSIPATION
FLUCTUATIONS
CIRCUIT SIMULATION
THERMAL ENGINEERING
THERMAL FORCE
FORCE FEEDBACK
TEMPERATURE DEPENDENCE
POWER ENGINEERING AND ENERGY
BIPOLAR TRANSISTORS

This publication has 2 references indexed in Scilit:

Analysis and measurement of nonlinear effects in power amplifiers caused by thermal power feedback
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
Transistormeßtechnik
Published by Springer Nature ,1966