Taking into Account Asynchronous Signals in Functional Test of Complex Circuits
- 1 January 1984
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 0738100X,p. 490-496
- https://doi.org/10.1109/dac.1984.1585843
Abstract
The proposed functional test method for complex circuits presents the following features: the test problem is studied in the aggregate; a test method, a test environment and automated test program generation are proposed; the circuit behavior is considered as a whole, including the response to instructions (or commands), and to signals at the same level. Emphasis is put on the signal test; an hardware which allows the test of signals and is compatible with functional testing is defined; a description language for signal timing diagrams is proposed.Keywords
This publication has 1 reference indexed in Scilit:
- Automatic Generation of Microprocessor Test ProgramsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1982